Simulation and Optimisation of Parasitic Impedances and EMI Behaviour of New Power Electronic Hardware Concept

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Diploma Thesis from the year 2005 in the subject Electrotechnology, grade: 1,0, Otto-von-Guericke-University Magdeburg (Institut für Elektrische Energiesysteme (IESY)), language: English, abstract: This diploma thesis presents methods and results of the simulative characterization of the electromagnetic compatibility (EMC) behaviour of a new low voltage motor drive hardware concept. The concept consists of double side cooled discrete semiconductor packages, which are integrated in a new power stage hardware topology. The overall EMC behaviour of such a drive is characterized by the semiconductor properties and additionally by two main factors: package parasitics and electromagnetic emission. Firstly, the switching behaviour of the drive is influenced by package parasitics that can cause transient voltage peaks. These peaks do not only lead to increased electromagnetic emission, but also influence the power losses, the voltage de-rating and therefore the silicone usage within the package. The characterization of the package parasitics is therefore an important task within the design phase of the drive. The methods and results of the parasitics extraction and switching behaviour analysis of both the discrete semiconductor package (µPP) and the new power stage hardware topology (2Cool) are presented within this thesis. Secondly, the electromagnetic emission caused by the drive was investigated through a numerical EMC field simulation program. With the aid of the various simulation result analysis and visualization possibilities of the EMC simulation program, it was possible to investigate the near and far electromagnetic fields as well as the current densities including eddy currents. The EMC characterisation and the optimisation of the 2Cool system are presented as well. Finally, an experimental validation of the achieved simulation results is demonstrated with the aid of a standard double pulse test. The comparison of simulation and experimental data shows a high

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EAN

9783668526112

ASIN

3668526117

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